Taiwan-based manufacturer of AI fabric inspection machines shows end-to-end fabric defect detection and data integration from inspection through spreading to cutting NEW TAIPEI CITY, April 30, 2026 ...

A new wafer inspection platform combines AI analytics, sub-micron imaging, SWIR sensing, and precision metrology to help ...

The Department of Science and Technology (DOST) has unveiled new equipment capable of analyzing materials and detecting ...

BMW researchers have demonstrated that camera-based inspection systems can catch manufacturing flaws in battery electrodes ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

State Grid Changzhou Power Supply Company has deployed drone-based ultraviolet (UV) imaging technology for the first time to enable precision inspection of distribution lines in Liyang, Changzhou. The ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Bullen Ultrasonics Research and Early Innovation Manager Eric Norton to Speak at Ceramics Expo 2026 on Technology Transfer ...